1. Regulations
  2. title 49
  3. chapter II
  4. part 236
  5. subpart E
  6. subjgrp 122
  7. § 236.577

View all text of Subjgrp 122 [§ 236.576 - § 236.577]

§ 236.577 - Test, acknowledgement, and cut-in circuits.

Test, acknowledgement, and cut-in circuits shall be tested at least once every twelve months.

[49 FR 3387, Jan. 26, 1984]

AUTHORITY: 49 U.S.C. 20102-20103, 20107, 20133, 20141, 20157, 20301-20303, 20306, 20501-20505, 20701-20703, 21301-21302, 21304; 28 U.S.C. 2461 note; and 49 CFR 1.89.

SOURCE: 33 FR 19684, Dec. 25, 1968, unless otherwise noted.

CITE AS: 49 CFR 236.577